The present description describes a method and apparatus for using a single exposure area scan interline transfer CCD imaging devices in TDI scanning mode. The user is enabled to obtain a high resolution area-scan image with very high sensitivity from a conventional interline transfer CCD imager. The user may select the number of TDI stages, and in some cases of multi-tap CCD structures, obtain a two dimensional area-scan image. Utilizing a conventional interline CCD imager for TDI scanning allows a normal image to be produced by switching the mode back and forth between TDI and conventional area scan imaging.